Charged particle beam apparatus

Details Charged particle beam apparatus Charged particle beam apparatus

2007-07-10

2007-07-10

Wells, Nikita (Department: 2881)

Radiant energy

Inspection of solids or liquids by charged particles

Electron probe type

C250S311000, C250S306000, C250S492200, C250S492300

Reexamination Certificate

active

11183906

ABSTRACT:
A charged particle beam apparatus obtains an image by detecting a generation signal inclusively indicative of secondary electrons generated from a specimen. The apparatus has an input unit for inputting current and voltage values to be applied to a charged particle optical system through which the charged particle beam travels, a memory unit for storing shape, position and physical properties of the charged particle optical system and accuracy of the applied current or voltage, an electromagnetic field calculation unit for calculating an electromagnetic field near a path of the charged particle beam, a charged particle trajectory calculation unit for calculating a trajectory of the charged particle beam in the calculated electromagnetic field, a memory unit for storing a result of the trajectory calculation and a controller for controlling the charged particle optical system on the basis of the result of the trajectory calculation.

REFERENCES:
patent: 6630681 (2003-10-01), Kojima
patent: 7022986 (2006-04-01), Shinada et al.
patent: 2002/0185599 (2002-12-01), Kimura et al.
patent: 2004/0108458 (2004-06-01), Gerlach et al.
patent: 2004/0222376 (2004-11-01), Sasaki et al.
patent: 2001-006588 (2001-01-01), None
patent: 2001-093831 (2001-04-01), None

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