Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2006-06-27
2006-06-27
Parker, Kenneth (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S314000, C257S317000
Reexamination Certificate
active
07067873
ABSTRACT:
A silicon based semiconductor device and method uses charge trapping to alter a density of carriers available in a channel of a field effect transistor (FET) for conduction. The charge trapping mechanism can be controlled by a source-drain bias voltages applied to the FET, so that the device can be turned off through a control mechanism separate from a gate voltage.
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King Tsu-Jae
Liu David K. Y.
Bever Hoffman & Harms LLP
Fenty Jesse A.
Harms Jeanette S.
Parker Kenneth
Progressant Technologies, Inc.
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