Image analysis – Applications
Reexamination Certificate
2007-04-03
2010-10-19
Tabatabai, Abolfazl (Department: 2624)
Image analysis
Applications
C502S300000
Reexamination Certificate
active
07817819
ABSTRACT:
A catalyst sample may contain both small and large metal particle distributions simultaneously. Characterizing the properties of the metal particles contained in each distribution is important to help describe catalytic performance and optimize catalysts. Monte Carlo simulations and dispersion measurements are employed to determine the relationship between dispersion parameters of each metal particle distribution. Various properties, such as the atom fraction and the surface atom fraction of each distribution can be determined.
REFERENCES:
patent: 5153158 (1992-10-01), Kioka et al.
patent: 6458741 (2002-10-01), Roark et al.
patent: 7585808 (2009-09-01), Malek et al.
Cai Juan
Larsson Mats I.
Nanostellar, Inc.
Patterson & Sheridan LLP
Tabatabai Abolfazl
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