Channel quality circuit in a sampled amplitude read channel

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

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714769, 714704, 360 53, G11C 2900

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active

059876344

ABSTRACT:
A channel quality circuit, incorporated within a sampled amplitude read channel utilized in a magnetic storage system, for processing and accumulating performance data from the individual read channel components, wherein the performance data is used to calibrate the read channel to operate in a particular environment, to estimate the bit error rate of the storage system, and to detect defects in the magnetic medium. The channel quality circuit generates a test pattern of digital data which is written to the storage system. Then, as the test pattern is read from the storage system, the channel quality circuit accumulates performance data from the read channel components. The test pattern is used to generate expected samples and expected sample errors relative to the samples read by the read channel. Gating logic is programmed to accumulate only the particular performance data of interest. The channel quality circuit computes auto and cross-correlations, squared errors, and threshold comparisons. A defect detection filter detects particular defects in the media. In order to predict the bit error rate of the storage system, the channel quality circuit accumulates noise auto-correlation data, confidence metrics from a sequence detector, and cross-correlation of expected sample errors with actual sample errors.

REFERENCES:
patent: 4118686 (1978-10-01), Lender
patent: 5060088 (1991-10-01), Dolivo et al.
patent: 5121260 (1992-06-01), Asakawa et al.
patent: 5121263 (1992-06-01), Kerwin et al.
patent: 5150379 (1992-09-01), Baugh et al.
patent: 5220466 (1993-06-01), Coker et al.
patent: 5243473 (1993-09-01), Lee
patent: 5258940 (1993-11-01), Coker et al.
patent: 5268848 (1993-12-01), Coker et al.
patent: 5278702 (1994-01-01), Wilson et al.
patent: 5341249 (1994-08-01), Abbott et al.
patent: 5355261 (1994-10-01), Taratorin
patent: 5357520 (1994-10-01), Arnett et al.
patent: 5359607 (1994-10-01), Nguyen et al.
patent: 5381359 (1995-01-01), Abbott et al.
patent: 5392295 (1995-02-01), Coker et al.
patent: 5400189 (1995-03-01), Sato et al.
patent: 5410439 (1995-04-01), Egbert et al.
patent: 5426541 (1995-06-01), Coker et al.
patent: 5490091 (1996-02-01), Kogen et al.
patent: 5493454 (1996-02-01), Ziperovich et al.
patent: 5544178 (1996-08-01), Zook
patent: 5754353 (1998-05-01), Behrens et al.
patent: 5761212 (1998-05-01), Forland, Jr. et al.
J.D. Coker, R.L. Galbraith, G.J. Kerwin, "Magnetic Characterization Using Elements of a PRML Channel," IEEE Transactions on Magnetics, vol. 27, No. 6, pp. 4544-4548, Nov. 1991.
W. Don Huber, "Single-Pass Flaw Detector for Magnetic Media," IEEE Transactions on Magnetics, vol. 30, No. 6, pp. 4149-4151, Nov. 1994.
U.S. application No. 08/545,965, Foland et al. filed Jun. 02, 1998.

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