Electronic digital logic circuitry – Security
Reexamination Certificate
2007-09-11
2007-09-11
Cho, James H. (Department: 2819)
Electronic digital logic circuitry
Security
C326S037000
Reexamination Certificate
active
11016220
ABSTRACT:
Techniques and systems whereby operation of and/or access to particular features of an electronic device may be controlled after the device has left the control of the manufacturer are provided. The operation and/or access may be provided based on values stored in non-volatile storage elements, such as electrically programmable fuses (eFUSES).
REFERENCES:
patent: 5898776 (1999-04-01), Apland et al.
patent: 5930826 (1999-07-01), Lee et al.
patent: 6753590 (2004-06-01), Fifield et al.
patent: 6814297 (2004-11-01), Mueller
IEEE Electron Device Letters, vol. 23, No. 9, Sep. 2002, “Electrically Programmable Fuse (eFUSE) Using Electromigration in Silicides”, by C. Kothandaraman and S. Iyer.
Erickson Karl R.
Fifield John A.
Kothandaraman Chandrasekharan
Paone Phil C.
Tonti William R.
Cho James H.
Patterson & Sheridan LLP
LandOfFree
Changing chip function based on fuse states does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Changing chip function based on fuse states, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Changing chip function based on fuse states will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3757614