Active solid-state devices (e.g. – transistors – solid-state diode – Including semiconductor material other than silicon or...
Reexamination Certificate
2007-12-04
2007-12-04
Rose, Kiesha L. (Department: 2822)
Active solid-state devices (e.g., transistors, solid-state diode
Including semiconductor material other than silicon or...
C257S441000, C438S040000, C438S282000
Reexamination Certificate
active
11201338
ABSTRACT:
Memory elements including a first electrode and a second electrode. A chalcogenide material layer is between the first and second electrodes and a tin-chalcogenide layer is between the chalcogenide material layer and the second electrode. A selenide layer is between the tin-chalcogenide layer and the chalcogenide material layer. Optionally, a metal layer, for example a silver layer, is between the tin-chalcogenide layer and the second electrode. Methods for forming the memory elements are also provided.
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Chhaya Swapneel
Dickstein & Shapiro LLP
Micro)n Technology, Inc.
Rose Kiesha L.
LandOfFree
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