Chain ferroelectric random access memory (CFRAM) having an...

Static information storage and retrieval – Systems using particular element – Ferroelectric

Reexamination Certificate

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C365S149000, C365S189070, C365S190000

Reexamination Certificate

active

11382098

ABSTRACT:
A chain type ferroelectric random access memory has a memory cell unit including ferroelectric memory cells electrically connected in series to each other, a plate line connected to an electrode of the memory cell unit, a bit line connected to the other electrode of the memory cell unit via a switching transistor, a sense amplifier which amplifies the voltages of this bit line and its complementary bit line, and a transistor inserted between the switching transistor and the sense amplifier. A value, being the minimum value of the gate voltage in the transistor obtained during elevation of the plate line voltage and comparative amplification, is smaller than a value, being the maximum value of the gate voltage in the transistor obtained during fall of the plate line voltage and comparative amplification. With these features, decrease in the accumulated charge of polarization in the memory cell is reduced and occurrence of disturb is prevented during read/write operations.

REFERENCES:
patent: 4494219 (1985-01-01), Tanaka et al.
patent: 4531202 (1985-07-01), Watanabe et al.
patent: 4831589 (1989-05-01), Brahmbhatt
patent: 5754466 (1998-05-01), Arase
patent: 5903492 (1999-05-01), Takashima
patent: 6094370 (2000-07-01), Takashima
patent: 6300654 (2001-10-01), Corvasce et al.
patent: 6483737 (2002-11-01), Takeuchi et al.
patent: 6735733 (2004-05-01), La Rosa
patent: 7002842 (2006-02-01), Tang et al.
patent: 7057927 (2006-06-01), Tang et al.
patent: 19724449 (1997-12-01), None
patent: 0293798 (1988-12-01), None
patent: 0631287 (1994-12-01), None
patent: 1-158691 (1989-06-01), None
patent: 9-120685 (1997-05-01), None
patent: 10-255483 (1998-09-01), None
patent: 11-177036 (1999-07-01), None
D. Takashima, et al., “Gain Cell Block Architecture for Gigabit-Scale Chain Ferroelectric RAM,” 1999 Symposium on VLSI Circuits, pp. 103-104.
D. Takashima et al., “High-Density Chain Ferroelectric Random-Access Memory (CFRAM),” Symposium on VLSI Circuits Digest of Technical Papers, 1997, pp. 83-84.
D. Takashima et al., “A Sub-40ns Random-Access Chain FRAM Architecture with a 7ns Cell-Plate-Line Drive,” ISSCC Digest of Technical Papers, Feb. 15, 1998, pp. 102-103, and 450.
JP Office Action, JP Appln. 11-155131, mailed Aug. 8, 2006.

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