Electrical computers and digital data processing systems: input/ – Input/output data processing – Input/output command process
Reexamination Certificate
2008-10-02
2010-11-02
Tsai, Henry (Department: 2184)
Electrical computers and digital data processing systems: input/
Input/output data processing
Input/output command process
C710S020000, C710S036000, C710S048000, C710S052000, C710S240000, C718S001000, C718S100000, C718S108000
Reexamination Certificate
active
07827321
ABSTRACT:
A measurement sampling facility takes snapshots of the central processing unit (CPU) on which it is executing at specified sampling intervals to collect data relating to tasks executing on the CPU. The collected data is stored in a buffer, and at selected times, an interrupt is provided to remove data from the buffer to enable reuse thereof. The interrupt is not taken after each sample, but in sufficient time to remove the data and minimize data loss.
REFERENCES:
patent: 6195730 (2001-02-01), West
patent: 6345324 (2002-02-01), Baskey et al.
patent: 6347341 (2002-02-01), Glassen et al.
patent: 6976083 (2005-12-01), Baskey et al.
patent: 6983303 (2006-01-01), Pellegrino et al.
patent: 7412492 (2008-08-01), Waldspurger
patent: 7478180 (2009-01-01), Li
patent: 7620938 (2009-11-01), Edwards et al.
patent: 7624240 (2009-11-01), Colbert et al.
patent: 7644302 (2010-01-01), Kambara et al.
patent: 2004/0111547 (2004-06-01), Arimilli et al.
patent: 2005/0223180 (2005-10-01), Derbeko
patent: 2007/0101070 (2007-05-01), Matsunami et al.
patent: 2008/0022032 (2008-01-01), Nicholas et al.
patent: 2008/0147887 (2008-06-01), Freimuth et al.
patent: 2008/0148015 (2008-06-01), Takamoto et al.
patent: 2008/0208927 (2008-08-01), Chikusa et al.
patent: 2009/0178036 (2009-07-01), Levine
patent: 2010/0036850 (2010-02-01), Garman et al.
patent: 2010/0088771 (2010-04-01), Heller et al.
patent: 2008027306 (2008-02-01), None
“Visualization of Particle Traces in Virtual Environments,” Kuester, F. et al., VRST'01 Nov. 15-17, pp. 151-157.
“Proactive Fault Tolerance for HPC with Xen Virtualization,” Nagarajan, A. et al., ICS'07, Jun. 18-20, 2007, pp. 23-32.
“z/Architecture Principles of Operation,” IBM® Publication No. SA22-7832-06, Seventh Edition, Feb. 2008.
Bartik Jane H.
Heller Lisa Cranton
Osisek Damian L.
Schmidt Donald W.
West, Jr. Patrick M.
Campbell John E.
Heslin Rothenberg Farley & & Mesiti P.C.
International Business Machines - Corporation
Schiller, Esq. Blanche E.
Tsai Henry
LandOfFree
Central processing unit measurement facility does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Central processing unit measurement facility, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Central processing unit measurement facility will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4181039