Cell for random access memory

Static information storage and retrieval – Systems using particular element – Flip-flop

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

257538, 257903, 257904, G11C 1100

Patent

active

053771400

ABSTRACT:
The memory ratio is improved and the data holding ability on reading data is enhanced by providing a resistive element between an access transistor and a flip-flop, which form a memory cell of a static memory. Even if the threshold voltage of the access transistor is lowered, the memory cell ratio can be increased. Accordingly, the minimum operating voltage can be lowered and the operating margin for a power source voltage can be increased and simultaneously with this, the soft error immunity can be enhanced. Since the memory cell ratio of the semiconductor memory of the present invention is enhanced by the resistive element, the necessity to preset a lower current drive ability of the access transistor for a drive transistor is decreased. As a result of this, the size of the memory cell can be decreased. Further, the current consumed by the memory cell is decreased by the resistive element.

REFERENCES:
patent: 4805147 (1989-02-01), Yamanaka et al.
patent: 4890148 (1989-12-01), Ikeda et al.
patent: 4975875 (1990-12-01), Ito
patent: 4995000 (1991-02-01), Tenell
patent: 5132929 (1992-07-01), Ochii

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Cell for random access memory does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Cell for random access memory, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Cell for random access memory will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-923377

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.