Cell arrangement method for designing semiconductor...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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C716S030000

Reexamination Certificate

active

07861202

ABSTRACT:
Logic circuit information in which flip-flops of a semiconductor integrated circuit subjected to designing and a logic circuit between flip-flops are defined is input. The logic circuit information is analyzed to detect a logic circuit sandwiched by two flip-flops. The number of logic stages of the detected logic circuit is counted. It is determined, according to the counted number of logic stages, to which substrate potential a cell used for the logic circuit is to be connected.

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Kuroda et al., “A High-Speed Low-Power 0.3μm CMOS Gate Array with Variable Threshold Voltage (VT) Scheme,” Semiconductor Device Engineering Laboratory, Toshiba Corp., IEEE, 1996, Kawasaki, Japan.

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