CDM ESD event protection in application circuits

Details CDM ESD event protection in application circuits CDM ESD event protection in application circuits

2006-02-07

2009-02-17

Whitmore, Stacy A (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000, C716S030000

Reexamination Certificate

active

07493576

ABSTRACT:
Methods and structure for improved design remediation for previously inexplicable damage to core circuits of an application circuit design caused by CDM ESD events. Features and aspects hereof note that such previously inexplicable damage to core circuits of an application circuit design is caused by inductive coupling between the non-core circuits and the core circuits of an application circuit design. Features and aspects hereof automatically alter an application circuit design to provide remediation by various techniques to reduce the magnitude of such inductive coupling and to thereby reduce susceptibility of the application circuit to damage from CDM ESD events. The modifications may be enforced as rules during initial design of the application circuit or as reconfiguration of a design in response to simulation to discover inappropriate coupling in the design.

REFERENCES:
patent: 2004/0098684 (2004-05-01), Amekawa
patent: 2006/0075368 (2006-04-01), Bakir et al.
M. Etherton, et al; Verification of CDM Circuit Stimulation Using an ESD Evaluation Circuit.

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