Chemistry: electrical and wave energy – Processes and products – Coating – forming or etching by sputtering
Reexamination Certificate
2002-02-15
2004-09-21
Versteeg, Steven (Department: 1753)
Chemistry: electrical and wave energy
Processes and products
Coating, forming or etching by sputtering
C204S192220, C204S298130, C148S423000, C420S428000, C420S578000, C423S324000, C423S326000
Reexamination Certificate
active
06793781
ABSTRACT:
BACKGROUND
1. Field of the Invention
The present invention relates generally to the art of sputtering silicon-containing target materials and to the art of fabricating cathode targets of silicon alloys comprising transition metal.
2. Description of Technical Considerations
U.S. Pat. Nos. 4,990,234 and 5,170,291 to Szczyrbowski et al. disclose sputtering silica and silicides, such as nickel silicide (NiSi
2
), in an oxidizing atmosphere to deposit dielectric oxide films.
U.S. Pat. No. 5,320,729 to Narizuka et al. discloses a sputtering target with which a high resistivity thin film consisting of chromium, silicon and oxygen can be produced. The target is formed by selecting the grain size of chromium powder and silicon dioxide powder drying the powders by heating and mixing the dried powders to obtain a mixed powder containing from 20 to 80 percent by weight of chromium, preferably 50 to 80 percent, the remainder being silicon dioxide, packing the mixed powder in a die, and sintering the packed powder by hot pressing to produce a target which has a two phase mixed structure. The sputtering target is used to manufacture thin film resistors and electrical circuits.
REFERENCES:
patent: 3555345 (1971-01-01), Collings et al.
patent: 4157315 (1979-06-01), Michels et al.
patent: 4450201 (1984-05-01), Brill et al.
patent: 4586957 (1986-05-01), Masumoto et al.
patent: 4721991 (1988-01-01), Ohtaki et al.
patent: 4758321 (1988-07-01), Vugts
patent: 4769291 (1988-09-01), Belkind et al.
patent: 4846949 (1989-07-01), Tu et al.
patent: 4847157 (1989-07-01), Goodman et al.
patent: 4857094 (1989-08-01), Groth et al.
patent: 4990234 (1991-02-01), Szczyrbowski et al.
patent: 4992087 (1991-02-01), Holscher
patent: 4992095 (1991-02-01), Nate et al.
patent: 5170291 (1992-12-01), Szczyrbowski et al.
patent: 5282946 (1994-02-01), Kinoshita et al.
patent: 5320729 (1994-06-01), Narizuka et al.
patent: 5417827 (1995-05-01), Finley
patent: 5709938 (1998-01-01), Finley
patent: 6139969 (2000-10-01), Finley
patent: 6274244 (2001-08-01), Finley et al.
patent: 6365014 (2002-04-01), Finley
patent: 550365 (1956-09-01), None
patent: 218493 (1985-02-01), None
patent: 0 226 993 (1987-07-01), None
patent: 0 233 003 (1987-08-01), None
patent: 0 239 280 (1987-09-01), None
patent: 0 281 894 (1988-09-01), None
patent: 0 301 755 (1989-02-01), None
patent: 0 546 302 (1993-06-01), None
patent: 2138026 (1984-10-01), None
patent: 2201428 (1988-09-01), None
patent: 59-157282 (1984-09-01), None
patent: 63-242948 (1988-10-01), None
patent: 2-250964 (1990-10-01), None
patent: 91-311723 (1991-10-01), None
patent: 4-276070 (1992-10-01), None
patent: 5-86456 (1993-04-01), None
patent: 5-247638 (1993-09-01), None
patent: 88/01568 (1988-03-01), None
patent: 90/09883 (1990-09-01), None
E. Randich et al., “Chemically Vapor-Deposited ZrB2, As a Selective Solar Absorber”, Thin Solid Films, 83 (1981) pp. 393-398.
B. Karlsson et al., “Optical Properties of CVD-Coated TiN, ZrN and HfN”, Solar Energy Materials, 7 (1983) pp. 401-411.
C. G. Ribbing et al., “Optical Properties of Noble Metal Like Films”, Thin Film Techologies II, SPIE vol. 652, (1986) pp. 166-178.
Valkonen et al., “Selective Transition of Thin TiN-Films”,SPIE Int. Soc. Opt. Eng.,1983, pp. 375-380.
Chemical Abstracts, vol. 111. No. 2, Jul. 10, 1989, Columbus, Ohio, US; abstract No. 11542q, p. 271; JP 63-242,948.
Chemical Abstracts, vol. 114, No. 18, May 6, 1991, Columbus, Ohio, US; abstract No. 169829k, p. 346, JP 02-233,534.
“Properties of d.c. Magnetron Sputtered NiSiOx-Films”by J. Szczyrbowski et al., SPIE vol. 1272, pp. 38-45,Optical Materials Technology for Energy and Solar Energy Conversion IX(1990).
Francois et al., “Reflectivity of ScNxThin Films: Comparison with TiNx, TiNxCyZrNxCoatings and Application to the Photothermal Conversation of Solar Energy”,Thin Solid Films,127 (1985) pp. 205-214.
U.S. patent Appln. Ser. No. 07/799,806 filed Nov. 29, 1991, now U.S. patent No. 6,274,244 (included above).
U.S. patent Appln. Ser. No. 07/981,706 filed Nov. 25, 1992, now U.S. patent No. 6,139,969 (included above).
U.S. patent Appln. Ser. No. 08/041,015 filed Mar. 31, 1993, now U.S. patent No. 5,417,827 (included above).
U.S. patent Appln. Ser. No. 08/398,932 filed Mar. 6, 1995, now U.S. patent No. 5,709,938 (included above).
U.S. patent Appln. Ser. No. 08/929,176 filed Sep. 8, 1997, now U.S. patent No. 6,365,014 (included above).
Miles Jacques B.
PPG Industries Ohio Inc.
Versteeg Steven
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