Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
Patent
1997-06-30
1998-10-20
Breneman, R. Bruce
Semiconductor device manufacturing: process
Chemical etching
Vapor phase etching
216104, 216109, 216103, 252 793, 438714, 438911, 438733, B44C 122
Patent
active
058246010
ABSTRACT:
A sacrificial oxide etching solution of carboxylic acid and HF having a high etch selectivity for silicon oxide relative to polysilicon, metal, and nitride. The solution is useful in the fabrication of microstructures having integrated electronics on the same chip. A carboxylic acid anhydride can be added to this solution to substantially remove all free water so that the etch selectivity to metal is improved. One specific solution is formed by mixing acetic acid, acetic anhydride, and aqueous HF.
REFERENCES:
patent: 2970044 (1961-01-01), Ostapkouich
patent: 4395304 (1983-07-01), Kern
J. Micromech, Microegn.7 (1997) R1-R13. Printed in UK; Review Article, "Silicon Dioxide Sacrificial Layer etching in Surface Micromaching"; J. Buhler, F-P Steiner and H. Galtes; pp. R1-R13.
Dao Patrick P. H.
Davison Michael J.
Dryer Paul William
Kniffin Margaret Leslie
Lue Ping-chang
Alanko Anita
Breneman R. Bruce
Dover Rennie William
Motorola Inc.
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