Capacitor, semiconductor device having the same, and method...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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Details

C257S310000, C257S311000, C257S532000

Reexamination Certificate

active

07132710

ABSTRACT:
A semiconductor device with a stack type capacitor having a lower electrode formed of an aluminum-doped metal, and a manufacturing method thereof are provided. The semiconductor device includes: a semiconductor substrate having a gate structure and an active region; an interlayer dielectric film formed on the active region; a lower electrode formed of a metal containing aluminum on the interlayer dielectric film; a dielectric layer formed on the lower electrode; an upper electrode formed on the dielectric layer; and a plug formed in the interlayer dielectric film to electrically connect the active region with the lower electrode. The method includes: forming a gate structure and an active region on a semiconductor substrate; forming an interlayer dielectric film on the resultant semiconductor substrate; forming a plug in the interlayer dielectric film to electrically connect with the active region; forming a mold oxidation layer on the plug and the interlayer dielectric film; patterning the mold oxidation layer with a predetermined pattern and forming a lower electrode of material containing aluminum on the plug; and sequentially forming a dielectric layer and an upper electrode on the lower electrode.

REFERENCES:
patent: 5626906 (1997-05-01), Summerfelt et al.
patent: 6376787 (2002-04-01), Martin et al.
patent: 6437967 (2002-08-01), Quick et al.
patent: 6753618 (2004-06-01), Basceri et al.
patent: 2002/0195633 (2002-12-01), Nagano et al.
patent: 2005/0082586 (2005-04-01), Tu et al.

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