Capacitor comprising improved TaO.sub.x -based dielectric

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

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257300, 257309, 257532, H01L 2710, H01L 2704, H01L 2978

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active

059775823

ABSTRACT:
A dielectric layer consisting essentially of Ta, Al, oxygen and nitrogen can have advantageous properties that make such a layer useful for thin film capacitors, typically capacitors for Si integrated circuits. For instance, a significantly greater fraction of capacitors according to the invention than of prior art tantalum oxide capacitors can store a charge of 3 .mu.coulomb/cm.sup.2. In a currently preferred embodiment, the dielectric layer has composition Ta.sub.1-y Al.sub.y O.sub.x N.sub.z, with y.about.0.1, x.about.2.4, and z.about.0.02. The dielectric layer can be formed by sputter deposition or any other appropriate deposition technique, e.g., chemical vapor deposition.

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