Capacitively induced electrostatic discharge protection circuit

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

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257360, 257296, H01L 2906, H01L 2990, H01L 2702

Patent

active

051737558

ABSTRACT:
An integrated circuit electrostatic discharge (ESD) protection circuit employs a capacitor and a zener diode to trigger a thick oxide ESD shunt field effect transistor (FET). When an ESD induced voltage at an input or output node reaches the turn-on voltage determined by the zener diode breakdown voltage, the shunting transistor is turned on by current capacitively coupled to the base of the parasitic bipolar transistor inherently formed in the thick oxide FET. The parasitic bipolar transistor is turned on in its saturated mode, substantially shorting the node to ground. At the end of the ESD event when the ESD induced current is no longer sufficient to keep the shunting transistor in its saturated mode, the shunting transistor turns off and the ESD protection circuit returns to its off mode, monitoring the input or output node for the occurrence of another ESD event.

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