Capacitively-coupled test probe

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters

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324149, 324158P, G01R 2726

Patent

active

052743365

ABSTRACT:
The invention is a capacitively coupled probe which can be used for non-contact acquisition of both analog and digital signals. The probe includes a shielded probe tip, a probe body which is mechanically coupled to the probe tip, and an amplifier circuit disposed within the probe body. The amplifier circuit receives a capacitively sensed signal from the probe tip and produces an amplified signal in response thereto. The amplifier has a large bandwidth to accommodate high-frequency digital signals. Further, the amplifier has a very low input capacitance and a high input resistance to reduce signal attenuation and loading of the circuit being probed. The amplifier circuit is disposed in the probe body closely adjacent to the probe tip in order to reduce stray and distributed capacitances. A reconstruction circuit reconstructs digital signals from the amplified capacitively sensed signal.

REFERENCES:
patent: 4318042 (1982-03-01), Eda et al.
patent: 4654603 (1987-03-01), Cox
patent: 4760342 (1988-07-01), Conrads et al.
patent: 4766368 (1988-08-01), Cox
patent: 4801866 (1989-01-01), Wixley
G. M. Ettinger, L. T. Shooter and M. Tillier, "Noncontact Test Signal Acquisition," Microprocessors and Microsystems, vol. 6, No. 2, Mar., 1982, pp. 69-71.
Neil Benjamin, "High-Impedance Capacitive Divider Probe For Potential Measurements In Plasmas", Rev. Sci. Instrum., vol. 53(10), Oct., 1982, pp. 1541-1543.

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