Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1992-01-14
1993-12-28
Wieder, Kenneth A.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324149, 324158P, G01R 2726
Patent
active
052743365
ABSTRACT:
The invention is a capacitively coupled probe which can be used for non-contact acquisition of both analog and digital signals. The probe includes a shielded probe tip, a probe body which is mechanically coupled to the probe tip, and an amplifier circuit disposed within the probe body. The amplifier circuit receives a capacitively sensed signal from the probe tip and produces an amplified signal in response thereto. The amplifier has a large bandwidth to accommodate high-frequency digital signals. Further, the amplifier has a very low input capacitance and a high input resistance to reduce signal attenuation and loading of the circuit being probed. The amplifier circuit is disposed in the probe body closely adjacent to the probe tip in order to reduce stray and distributed capacitances. A reconstruction circuit reconstructs digital signals from the amplified capacitively sensed signal.
REFERENCES:
patent: 4318042 (1982-03-01), Eda et al.
patent: 4654603 (1987-03-01), Cox
patent: 4760342 (1988-07-01), Conrads et al.
patent: 4766368 (1988-08-01), Cox
patent: 4801866 (1989-01-01), Wixley
G. M. Ettinger, L. T. Shooter and M. Tillier, "Noncontact Test Signal Acquisition," Microprocessors and Microsystems, vol. 6, No. 2, Mar., 1982, pp. 69-71.
Neil Benjamin, "High-Impedance Capacitive Divider Probe For Potential Measurements In Plasmas", Rev. Sci. Instrum., vol. 53(10), Oct., 1982, pp. 1541-1543.
Crook David T.
Heumann John M.
McDermid John E.
Peiffer Ronald J.
Schlotzhauer Ed O.
Brown Glenn W.
Hewlett--Packard Company
Wieder Kenneth A.
LandOfFree
Capacitively-coupled test probe does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Capacitively-coupled test probe, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Capacitively-coupled test probe will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1545917