4. Electricity: measuring and testing
  5. Impedance, admittance or other quantities representative of...
  6. Lumped type parameters

Ed O. Schlotzhauer

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Capacitively-coupled test probe

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent

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System and method for detecting short, opens and connected pins

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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System and method for detecting shorts, opens and connected pins

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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System and method for detecting shorts, opens and connected pins

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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System and method for detecting shorts, opens and connected...

Electricity: measuring and testing – Plural – automatically sequential tests
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1532582

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