Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2005-09-06
2005-09-06
Deb, Anjan (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
Reexamination Certificate
active
06940291
ABSTRACT:
Methods and systems for capacitive proximity and contact sensing employ one or more simple sensors (which may be a conductive fiber or pattern of conductive ink) in communication with a microcontroller. Digital signal processing executed by the microcontroller enables resolution enhancement, automatic and continuous calibration, noise reduction, pattern recognition and the configuration of virtual sensors capable of detecting how an object incorporating the sensors is being manipulated.
REFERENCES:
patent: 4588348 (1986-05-01), Beni et al.
patent: 5033291 (1991-07-01), Podoloff et al.
patent: 5319569 (1994-06-01), Nichols et al.
patent: 5505072 (1996-04-01), Oreper
patent: 5756904 (1998-05-01), Oreper et al.
patent: 5905209 (1999-05-01), Oreper
patent: 5933102 (1999-08-01), Miller et al.
patent: 5989700 (1999-11-01), Krivopal
patent: 6032542 (2000-03-01), Warnick et al.
patent: 6272936 (2001-08-01), Oreper et al.
Deb Anjan
Gesmer Updegrove LLP
He Amy
IRobot Corporation
LandOfFree
Capacitive sensor systems and methods with increased... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Capacitive sensor systems and methods with increased..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Capacitive sensor systems and methods with increased... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3435467