Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1989-09-05
1991-12-03
Harvey, Jack B.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324661, 324688, 324690, G01R 2726
Patent
active
050703021
ABSTRACT:
A capacitance probe (10) includes readily removable outer layers (64,66) which facilitate its use in the field to measure the width of slots or clearances (12) of different widths; an optionally perforated guard electrode (64,66,76,82) which permits width measurements over wider side wall bands with minimal effect on sensitivity; convergent or tapered side edges (102) to ease insertion and movement of the probe and a carrier block (124) which ensures proper positioning of the probe within such slots.
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Graff Ernest A.
Marcus Michael A.
Eastman Kodak Company
Harvey Jack B.
Snee Charles E.
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