Communications: electrical – Condition responsive indicating system – Specific condition
Reexamination Certificate
2010-07-28
2010-11-23
Lee, Benjamin C (Department: 2612)
Communications: electrical
Condition responsive indicating system
Specific condition
C340S561000, C340S657000, C324S519000, C324S686000, C324S687000, C324S688000
Reexamination Certificate
active
07839282
ABSTRACT:
The disclosure relates to analysis of materials using a capacitive sensor to detect anomalies through comparison of measured capacitances. The capacitive sensor is used in conjunction with a capacitance measurement device, a location device, and a processor in order to generate a capacitance versus location output which may be inspected for the detection and localization of anomalies within the material under test. The components may be carried as payload on an inspection vehicle which may traverse through a pipe interior, allowing evaluation of nonmetallic or plastic pipes when the piping exterior is not accessible. In an embodiment, supporting components are solid-state devices powered by a low voltage on-board power supply, providing for use in environments where voltage levels may be restricted.
REFERENCES:
patent: 4481816 (1984-11-01), Prentice
patent: 4581938 (1986-04-01), Wentzell
patent: 4852391 (1989-08-01), Ruch et al.
patent: 4986314 (1991-01-01), Himmler
patent: 5864229 (1999-01-01), Lund
patent: 6249130 (2001-06-01), Greer
patent: 6427602 (2002-08-01), Hovis et al.
patent: 6781387 (2004-08-01), Goldfine et al.
patent: 7414395 (2008-08-01), Gao et al.
patent: 2005/0030724 (2005-02-01), Ryhanen et al.
patent: 2005/0040832 (2005-02-01), Steele et al.
patent: 2005/0069178 (2005-03-01), Nysaether et al.
patent: 2005/0104600 (2005-05-01), Cotton
patent: 2005/0253597 (2005-11-01), Miller
Anderson Rodney
Condon Christopher M.
Driscoll Daniel J.
Fincham, Jr. William L.
Mathur Mahendra P.
Bee Andrew
Dvorscak Mark P.
Lee Benjamin C
Potts James B.
The United States of America as represented by the United States
LandOfFree
Capacitance probe for detection of anomalies in non-metallic... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Capacitance probe for detection of anomalies in non-metallic..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Capacitance probe for detection of anomalies in non-metallic... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4212941