Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-12-11
2007-12-11
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C438S018000
Reexamination Certificate
active
11153047
ABSTRACT:
A method of modeling capacitance for all practical 2D on-chip wire structures including coplanar and microstrip structures. The method includes using a field lines approach (600) to obtain capacitance expressions for structure components, combining the expressions (704) for components of the subject structure and obtaining a capacitance expression (705) for the subject structure. The static capacitance matrix for the structure is calculated from the capacitance expression. The structure components can include components with parallel plate field lines, quarter circle field lines, singularity field lines, singularity field lines with restriction, double set of quarter circle field lines which are used as building blocks for the subject structure. The final capacitance expressions can be used for the modeling of critical on-chip wires and devices as well as inside a capacitance extraction tool.
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Goren David
Shlafman Shlomo
Chiang Jack
Dimyan Magid Y.
International Business Machines - Corporation
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