CAM test structures and methods therefor

Details CAM test structures and methods therefor CAM test structures and methods therefor

2008-05-20

2008-05-20

Louis-Jacques, Jacques H (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C365S200000, C365S189050

Reexamination Certificate

active

10635348

ABSTRACT:
Configurations and methods that enable the testing of CAM-specific circuitry, even if the memory is defective, are implemented by utilizing various test modes. Accordingly, the CAM can be debugged to isolate memory failures from priority encoder failures, which significantly reduces the need for design changes. The present invention provides the ability to test the CAM functions very efficiently, thereby reducing the test time.

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patent: 6564344 (2003-05-01), Bui et al.
patent: 6691252 (2004-02-01), Hughes et al.
patent: 6999331 (2006-02-01), Huang

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