Calibration standard for X-ray fluorescence thickness

Details Calibration standard for X-ray fluorescence thickness Calibration standard for X-ray fluorescence thickness

1985-03-28

1987-02-24

Church, Craig E.

X-ray or gamma ray systems or devices

Accessory

Testing or calibration

378 56, 378 48, 378 50, G01N 2306, G01B 1502, G01D 1800

Patent

active

046463410

ABSTRACT:
Improved calibration standard construction for X-ray fluorescence thickness measurement gauges formed of one or more plated layers of known character and thickness disposed on an apertured supporting foil base and accessible to X-radiation through an aperture at the base of a conically shaped bore in a surrounding protective housing member.

REFERENCES:
patent: 2711481 (1955-06-01), Phillips
patent: 3307036 (1967-02-01), Bouvelle
patent: 4150288 (1979-04-01), Inoue et al.
patent: 4162528 (1979-07-01), Maldonado et al.
patent: 4406015 (1983-09-01), Koga
patent: 4577338 (1986-03-01), Takahashi et al.

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