4. X-ray or gamma ray systems or devices
  5. Accessory
  6. Testing or calibration

Robert O. Wahl

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Calibration standard for X-ray fluorescence thickness

X-ray or gamma ray systems or devices – Accessory – Testing or calibration
Patent

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Probe assembly for measuring conductivity of plated through hole

Electricity: measuring and testing – Conductor identification or location – Inaccessible
Patent

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Probe guide and holder

Geometrical instruments – Area integrators – Electrical
Patent

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Profile ID: LFUS-PAI-P-238234

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