Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-01-29
2009-10-13
Rossoshek, Helen (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C174S261000, C174S265000, C174S13800J
Reexamination Certificate
active
07603645
ABSTRACT:
A calibration method of insulating washer in a circuit board is provided, which includes steps of (a) establishing an equivalent circuit model corresponding to a metal via; (b) depicting an electric characteristic curve corresponding to the model; (c) calculating a capacitance and an inductance equation corresponding to the curve; (d) substituting parameter values of the equivalent circuit model, capacitance equation, and inductance equation into a characteristic impedance expression for being calculated, so as to obtain a first radius length value of an insulating washer for the metal via; (e) making a temporary insulating washer by employing the value; (f) reestablishing an equivalent circuit model corresponding to the metal via according to the temporary insulating washer; repeating Steps (b), (c), (d), (e), and (f); and when the first radius length value is converged into a fixed value, determining the fixed value as an optimum value for designing the insulating washer.
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Lai Chun-Yu
Su Yu-Li
Inventec C'orporation
Rabin & Berdo P.C.
Rossoshek Helen
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