Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-12-06
2005-12-06
Do, Thuan (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
06973633
ABSTRACT:
One or more control points are identified within a reticle layout that is used in a simulation of a manufacturing process for an integrated device layer. Further, a current geometrical layout pattern is determined in the vicinity of the control points, and a cache is searched for a matching geometrical layout pattern. If the search is successful, a simulation result associated with the matching geometrical layout pattern is retrieved from the cache and reused for the current geometrical layout pattern. Alternatively, if the search is unsuccessful, a simulation result associated with the current geometrical design pattern is computed and stored in the cache for future reuse.
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Cobb Nick
Lippincott George
Todd Robert
Christensen O'Connor Johnson & Kindness PLLC
Do Thuan
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