Built-in test signal attenuation circuit

Details Built-in test signal attenuation circuit Built-in test signal attenuation circuit

2005-04-12

2005-04-12

Decady, Albert (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Data pulse evaluation/bit decision

C714S733000

Reexamination Certificate

active

06880114

ABSTRACT:
A test signal attenuation circuit is built into a signal transmitter for modifying the energy content of the transmitter output signal. The built-in test signal attenuation circuit includes circuits for generating an attenuated, degraded, chopped signal. The built-in test signal attenuation circuit may be used for purposes of testing the performance of a link under degraded conditions.

REFERENCES:
patent: 4808939 (1989-02-01), Kingston

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