Built-in test circuit for static CMOS circuits

Details Built-in test circuit for static CMOS circuits Built-in test circuit for static CMOS circuits

1990-10-05

1992-03-17

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 731, 371 225, 371 295, G01R 3128, G06F 1100

Patent

active

050972065

ABSTRACT:
A built-in test circuit configuration for row based static CMOS integrated circuits using a control circuit and a plurality of switching circuits, each connecting VDD to a row power buss through a large pass transistor during normal operating modes and through a low current pull up transistor during the test mode of operation. Defect induced currents are detected by the OR'd outputs of the switching circuits connected to an OR function formed in the control circuit. Additional switching circuits are provided for supplying multiple main power supplies to each integrated circuit row. The switching and additional switching circuits may be physically configured beneath row end caps.

REFERENCES:
patent: 4631724 (1986-12-01), Shimizu
patent: 4637020 (1987-01-01), Schinabeck
patent: 4710704 (1987-12-01), Ando
patent: 4820974 (1989-04-01), Katsura et al.
Phil Nigh and Wojciech Maly, "A Self-testing ALU Using Built-in Current Sensing", 1989, IEEE Custom Integrated Circuits Conference, pp. 22.1.1-22.1.4.

Affiliated with

Also associated with

Rating

Built-in test circuit for static CMOS circuits does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Built-in test circuit for static CMOS circuits, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Built-in test circuit for static CMOS circuits will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1478637