Built in self test with memory

Details Built in self test with memory Built in self test with memory

1997-07-02

1998-06-09

Canney, Vincent P.

Excavating

G06F 1100

Patent

active

057646554

ABSTRACT:
An integrated circuit chip and an electronic system are disclosed, each incorporating a self-test system. The integrated circuit chip includes capability for Built In Self Test (BIST) and a non-volatile memory where the BIST may be self-programmable. The electronic system comprises, an integrated circuit chip which includes on the chip Built In Self Test (BIST) and a non-volatile memory, together with an off-chip test target. The integrated circuit chip and the electronic system are particularly useful for simplifying the testing of electronic products both in manufacturing and in the field, and are even more particularly useful in eliminating the need for large, complex, high speed testers in the manufacturing environment, substituting instead a simple power chuck to plug the product into.

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Toshio Takeshima, et al, "A 55-NS 16-MB DRAM With Built-In Self-Test Function Using Microprogram ROM", IEEE Journal of Solid-State Circuits, vol. 25, No. 4, Aug. 1990, pp. 903-911.

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