Built-in self test system and method

Details Built-in self test system and method Built-in self test system and method

2007-01-02

2007-01-02

Beausoliel, Robert (Department: 2113)

Error detection/correction and fault detection/recovery

Data processing system error or fault handling

Reliability and availability

C714S005110, C714S030000, C714S033000, C714S042000, C714S047300, C714S718000

Reexamination Certificate

active

10435842

ABSTRACT:
External test equipment is used to simulate an internal BIST test, thus enabling the capture or generation of detailed test results. By simulating the BIST test sequence in real time during the test, the external tester may monitor an output from the BIST and determine the exact location of failures when they occur. The external tester may generate a bit fail map indicating whether each memory location passed or failed the BIST test.

REFERENCES:
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patent: 6388930 (2002-05-01), Obremski
patent: 6400619 (2002-06-01), Hsu et al.
patent: 6445626 (2002-09-01), Hsu et al.
patent: 6452848 (2002-09-01), Obremski et al.
patent: 6519725 (2003-02-01), Huisman et al.
patent: 2002/0059543 (2002-05-01), Cheng et al.
patent: 2002/0199136 (2002-12-01), Ku
patent: 2004/0049720 (2004-03-01), Boehler

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