Built-in self-test circuit

Details Built-in self-test circuit Built-in self-test circuit

2006-10-03

2006-10-03

Beausoliel, Robert (Department: 2113)

Error detection/correction and fault detection/recovery

Data processing system error or fault handling

Reliability and availability

C714S033000, C714S715000, C714S718000, C714S719000

Reexamination Certificate

active

07117394

ABSTRACT:
A built-in self-test (BIST) circuit is configured to divide data output bits of a RAM macro into a plurality of groups each consisting of 2 bits, and provide a 1-bit comparator of a signature analyzer for each group to share one 1-bit comparator by respective two data output bits. A selector of a bit changer sequentially selects a data output bit from each group, and the 1-bit comparator sequentially compares output data for the selected data output bit with expected value data.

REFERENCES:
patent: 5555249 (1996-09-01), Hilley et al.
patent: 5557619 (1996-09-01), Rapoport
patent: 6301678 (2001-10-01), Sato et al.

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