Built-in self repair for an integrated circuit

Electronic digital logic circuitry – Reliability – Redundant

Reexamination Certificate

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C326S038000, C327S525000

Reexamination Certificate

active

06972587

ABSTRACT:
An integrated circuit, such as a memory device, includes a built-in repair circuit. The repair circuit includes an on-chip source that produces a programming signal of sufficient duration and magnitude to program a programmable element that normally isolates a secondary circuit, such as redundant circuitry, from the remainder of the circuits on the device. Once programmed, the redundant circuitry may take the place of failed circuitry, and thus repair the device.

REFERENCES:
patent: 5790448 (1998-08-01), Merritt et al.
patent: 6094385 (2000-07-01), Trimberger
patent: 6327178 (2001-12-01), Blodgett
patent: 6351140 (2002-02-01), Cutter et al.
patent: 6366118 (2002-04-01), Oh et al.
Arcioni et al., “Designand Characterization of SiIntegrated Inductors,” May 1998.

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