Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2005-04-19
2005-04-19
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C702S059000, C714S025000, C714S027000
Reexamination Certificate
active
06882950
ABSTRACT:
Building and testing complex electronic products especially large scale computer systems are handled with control remaining with the owner of the design while a contract manufacturer does the basic manufacturing processes and testing. Nearly all levels of testing are accomplished without sharing high level descriptions of the end product or its features by providing only low level files for test functions. Testing is accomplished without sharing the high level code descriptive of the system design so confidential information is retained. Testing using the low level data is made sufficient to identify what parts need repair despite the lack of high-level information transfer.
REFERENCES:
patent: 20020170000 (2002-11-01), Gorodetsky et al.
Jennion Mark W.
Maciona Gerald J.
Shramko William K.
Atlass Michael B.
Barlow John
Starr Mark T.
Unisys Corporation
Walling Meagan S
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