Active solid-state devices (e.g. – transistors – solid-state diode – Thin active physical layer which is – Heterojunction
Reexamination Certificate
2009-02-13
2010-12-14
Ghyka, Alexander G (Department: 2812)
Active solid-state devices (e.g., transistors, solid-state diode
Thin active physical layer which is
Heterojunction
C257S189000, C257S190000, C257SE29249
Reexamination Certificate
active
07851781
ABSTRACT:
Various embodiments provide a buffer layer that is grown over a silicon substrate that provides desirable device isolation for devices formed relative to III-V material device layers, such as InSb-based devices, as well as bulk thin film grown on a silicon substrate. In addition, the buffer layer can mitigate parallel conduction issues between transistor devices and the silicon substrate. In addition, the buffer layer addresses and mitigates lattice mismatches between the film relative to which the transistor is formed and the silicon substrate.
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Chow Loren A.
Fastenau Joel M.
Hudait Mantu K.
Liu Amy W. K.
Loubychev Dmitri
Ghyka Alexander G
Intel Corporation
Nikmanesh Seahvosh J
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