Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2007-11-01
2010-06-22
Lee, Calvin (Department: 2892)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C438S399000
Reexamination Certificate
active
07741672
ABSTRACT:
In a fin-type field effect transistor (FinFET) structure, a gate strap is positioned on the top of a gate conductor and runs along the gate conductor. The top of the gate strap is positioned a greater height above the top surface of the substrate than the top of the fin cap. The gate strap is conformal and, therefore, the top of the portion of the gate strap that crosses the fin cap has a greater height above the top surface of the substrate than top portions of other regions of the gate strap. Further, the material of the gate strap can have a different work function than a material of the gate conductor.
REFERENCES:
patent: 6432829 (2002-08-01), Muller et al.
patent: 7288805 (2007-10-01), Anderson et al.
patent: 2009/0101978 (2009-04-01), Anderson et al.
Anderson Brent A.
Bryant Andres
Nowak Edward J.
Gibb I.P. Law Firm LLC
International Business Machines - Corporation
Lee Calvin
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