Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making
Patent
1997-12-23
2000-12-26
Hamilton, Cynthia
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Radiation sensitive composition or product or process of making
526259, 526284, G03F 711
Patent
active
061656844
ABSTRACT:
A composition for a bottom anti-reflective coating material and a method for forming a resist pattern using the composition, which are high in the dry etching rate, high in the resolution, excellent in the resist film thickness dependency and high in the effect of preventing reflective light against exposure light, and provide no intermixing with the photoresist layer, are disclosed, wherein the composition for a bottom anti-reflective coating material comprises a naphthalene group-containing polymer compound having a specific structure.
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patent: 5401614 (1995-03-01), Dichiara et al.
patent: 5693691 (1997-12-01), Flaim et al.
patent: 5919599 (1999-07-01), Meador et al.
Mizutani Kazuyoshi
Momota Makoto
Fuji Photo Film Co. , Ltd.
Hamilton Cynthia
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