Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1995-09-08
1996-11-19
Evans, F. L.
Optics: measuring and testing
By polarized light examination
With light attenuation
356376, 25055934, G01B 1100, G01B 1124
Patent
active
055768288
ABSTRACT:
The height of a wire bonded between a semiconductor chip and a lead frame being determined using an illumination from circularly arranged LED's installed in a low-angle illuminating device. The angle of the illumination is set at seven (7) to twelve (12) degrees, preferably at ten (10) degrees, with respect to a horizontal plane, and a focal depth of an optical device is set to be shallow, thus letting a dark area appear in the central portion of the wire at the focal point of the optical system.
REFERENCES:
patent: 4942618 (1990-07-01), Sumi et al.
patent: 5030008 (1991-07-01), Scott et al.
patent: 5347362 (1994-09-01), Sugawara
Nagai Satoru
Tomiyama Hiromi
Evans F. L.
Kabushiki Kaisha Shinkawa
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