Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Wire contact – lead – or bond
Reexamination Certificate
2005-09-27
2005-09-27
Williams, Alexander Oscar (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Combined with electrical contact or lead
Wire contact, lead, or bond
C257S786000, C257S773000, C257S730000, C257S775000, C257S776000, C257S777000, C257S696000, C257S691000, C257S698000, C257S674000, C029S827000
Reexamination Certificate
active
06949837
ABSTRACT:
A variety of pad arrangements are provided for semiconductor devices for reducing the likelihood of bonding failures, particularly those due to shorts, and/or for reducing the difference in length between bonding wires to decrease signal skew during operation of the semiconductor device and improve signal integrity.
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Kim Jae-Hoon
Lee Ho-Cheol
Ryu Jung-Su
Harness & Dickey & Pierce P.L.C.
Samsung Electronics Co,. Ltd.
Williams Alexander Oscar
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