Active solid-state devices (e.g. – transistors – solid-state diode – Responsive to non-electrical signal – Physical deformation
Reexamination Certificate
2011-01-04
2011-01-04
Chu, Chris (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Responsive to non-electrical signal
Physical deformation
C257SE25027, C257S254000, C257S531000, C257S686000, C257S777000, C333S133000, C333S187000, C333S189000, C333S191000, C438S050000, C438S052000
Reexamination Certificate
active
07863699
ABSTRACT:
Bonded wafer packages having first and second wafers bonded together forming a matrix of sealed devices, at least one of the wafers having a plurality of passive devices formed thereon, including at least one BAW resonator within each of the sealed devices, the first wafer having conductor filled through-holes forming electrical connections between the passive devices and connections assessable from outside the sealed devices, the bonded wafers being diced to form individual sealed devices. The devices may be duplexers, interstage filters or other circuits such as VCOs and RF circuits. Various embodiments are disclosed.
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Dropmann Hans
Sridhar Uppili
Stuebing Carlton
Blakely , Sokoloff, Taylor & Zafman LLP
Chu Chris
Triquint Semiconductor, Inc.
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