Bitline structure for DRAM and method of forming the same

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257S382000

Reexamination Certificate

active

07075138

ABSTRACT:
A bitline structure for DRAM and the method for forming the same. The bitline structure includes a first dielectric layer on a substrate, a bitline contact hole, formed through the first dielectric layer, a bitline contact, formed in the bitline contact hole, a second dielectric layer, formed on the first dielectric layer and covering the bitline contact, a peripheral contact hole, formed through the first dielectric layer and the second dielectric layer, a peripheral contact, formed in the peripheral contact hole, a first bitline, formed in the second dielectric layer and contacting the bitline contact, and a second bitline, formed in the second dielectric layer and contacting the peripheral contact.

REFERENCES:
patent: 6008084 (1999-12-01), Sung
patent: 6255685 (2001-07-01), Kuroda
patent: 6784501 (2004-08-01), Lane et al.
patent: 6790771 (2004-09-01), Wu

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