Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system – Circuit simulation
Reexamination Certificate
2011-04-26
2011-04-26
Frejd, Russell (Department: 2128)
Data processing: structural design, modeling, simulation, and em
Simulating electronic device or electrical system
Circuit simulation
C703S002000, C702S057000, C702S179000
Reexamination Certificate
active
07933760
ABSTRACT:
A method of simulating operation of a bitcell includes determining sensitivities of a bitcell model to different component characteristics and device parameters, such as device temperature, operating voltage, and process characteristics. The determined sensitivities are normalized, so that each normalized value represents the relative sensitivity of the bitcell, under the simulated device parameters, to the component characteristic associated with the value. The normalized sensitivity values can be scaled based on a tolerance factor, and the adjusted sensitivities used to model the behavior of each component of the bitcell in subsequent simulations.
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Kasprak Keith
Priore Donald A.
Schreiber Russell
Advanced Micro Devices , Inc.
Frejd Russell
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