Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate
2008-11-14
2010-11-16
Nguyen, Viet Q (Department: 2827)
Static information storage and retrieval
Floating gate
Particular biasing
C365S203000, C365S204000, C365S185180
Reexamination Certificate
active
07835191
ABSTRACT:
A NAND EEPROM having a shielded bit line architecture reduces supply voltage and ground noise resulting from charging or discharging bit lines. The EEPROM has a PMOS pull-up transistor and an NMOS pull down transistor connected to a virtual power node. A control circuit for charging or discharging bit lines controls the gate voltage of the PMOS or NMOS transistor to limit peak current when charging or discharging bit lines via the virtual power node. In particular, the control circuit operates the PMOS or NMOS transistor in a non-saturation mode to limit current. One such control circuit creates a current mirror or applies a reference voltage to control gate voltages. A programming method sets up bit lines by pre-charging unselected bit lines via the PMOS pull-up transistor having controlled gate voltage while latches in the programming circuitry charge or discharge selected bit lines according to respective data bits being stored. Another bit line setup includes two stages. A first stage pre-charges all bit lines via PMOS pull-up, and the second stage uses the latches to discharge or leave charged the selected bit lines depending on respective data bits being stored. The gate voltages of NMOS transistors in the programming circuitry can be controlled to reduce noise caused by discharging selected bit lines through the latches.
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Search Report.
Harness & Dickey & Pierce P.L.C.
Nguyen Viet Q
Samsung Electronics Co,. Ltd.
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