Bit error rate tester implemented in a programmable logic...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Error count or rate

Reexamination Certificate

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C714S725000

Reexamination Certificate

active

10725898

ABSTRACT:
The present invention provides a bit error rate tester implemented in a programmable logic device. Any or all of the components of the bit error rate tester may be implemented through software by programming the programmable logic circuitry of the programmable logic device to implement the components of the bit error rate tester. The bit error tester may determine the bit error rate of any suitable interface either within the programmable logic device or external to the programmable logic device. In order to allow a user to interact with the bit error rate tester, user equipment, such as a personal computer, may be coupled to the bit error rate tester.

REFERENCES:
patent: 6628621 (2003-09-01), Appleton et al.
patent: 7032139 (2006-04-01), Iryami et al.
patent: 2005/0050190 (2005-03-01), Dube
“How Programmable Logic Works” by Michael Barr published Jun. 1999, Embedded Systems Programming on pp. 75-84 located on the web at http://www.netrino.com/Articles/ProgrammableLogic/index.html.
“Jitter Fundamentals: Agilent N4900 Serial BERT Series Jitter Injection and Analysis Capabilities,” Application Note, Agilent Technologies, Nov. 2003, pp. 1-24.
“Understanding and Characterizing Timiing Jitter,” Tektronix, www.tektronix.com/jitter, 2003, pp. 1-24.
“Annex 48B: Jitter test methods,” IEEE Std 802.3ae-2002, IEEE, 2002, pp. 505-514.
Wang, et al., “Equalization Techniques,” Carleton University, presentation slides.

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