Error detection/correction and fault detection/recovery – Pulse or data error handling – Error count or rate
Reexamination Certificate
2007-03-20
2007-03-20
Britt, Cynthia (Department: 2138)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Error count or rate
C714S725000
Reexamination Certificate
active
10725898
ABSTRACT:
The present invention provides a bit error rate tester implemented in a programmable logic device. Any or all of the components of the bit error rate tester may be implemented through software by programming the programmable logic circuitry of the programmable logic device to implement the components of the bit error rate tester. The bit error tester may determine the bit error rate of any suitable interface either within the programmable logic device or external to the programmable logic device. In order to allow a user to interact with the bit error rate tester, user equipment, such as a personal computer, may be coupled to the bit error rate tester.
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patent: 2005/0050190 (2005-03-01), Dube
“How Programmable Logic Works” by Michael Barr published Jun. 1999, Embedded Systems Programming on pp. 75-84 located on the web at http://www.netrino.com/Articles/ProgrammableLogic/index.html.
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Ren Kaiyu
Wong San
Altera Corporation
Britt Cynthia
Fish & Neave IP Group Ropes & Gray LLP
Shvarts Alexander
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