Bis-o-nitrophenols derivatives and poly-o-hydroxyamides,...

Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate

Reexamination Certificate

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C438S758000, C438S778000, C528S271000, C558S270000, C558S271000, C558S272000

Reexamination Certificate

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07125814

ABSTRACT:
Materials for dielectrics and/or buffer layers in microelectronics utilize polymers can be based on bis-o-nitrophenols. The bis-o-nitrophenols carry a tert-butoxycarbonyl group on at least one of the hydroxyl groups. The polybenzoxazoles prepared from these compounds have a lower dielectric constant than corresponding polymers which are prepared from bis-o-nitrophenols that do not have a tert-butoxycarbonyl group.

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patent: 5099057 (1992-03-01), Lysenko et al.
patent: 5726279 (1998-03-01), Sezi et al.
patent: 0 317 942 (1989-05-01), None
patent: 09-020782 (1997-01-01), None
Machine Translation of JP 09-020782, provided by JPO website.
Copending U.S. Appl. No. 10/244,839, Sezi, filed Sep. 16, 2002.
Copending U.S. Appl. No. 10/244,802, Sezi, filed Sep. 16, 2002.
Copending U.S. Appl. No. 10/244,280, Sezi, filed Sep. 16, 2002.

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