Semiconductor device manufacturing: process – Forming bipolar transistor by formation or alteration of... – Having heterojunction
Reexamination Certificate
2006-08-15
2006-08-15
Smith, Zandra V. (Department: 2822)
Semiconductor device manufacturing: process
Forming bipolar transistor by formation or alteration of...
Having heterojunction
C438S309000, C438S312000, C438S350000, C257SE21350
Reexamination Certificate
active
07091099
ABSTRACT:
A bipolar transistor includes a Si single crystalline layer serving as a collector, a single crystalline Si/SiGeC layer and a polycrystalline Si/SiGeC layer which are formed on the Si single crystalline layer, an oxide film having an emitter opening portion, an emitter electrode, and an emitter layer. An intrinsic base layer is formed on the single crystalline Si/SiGeC layer, part of the single crystalline Si/SiGeC layer, the polycrystalline Si/SiGeC layer and the Co silicide layer together form an external base layer. The thickness of the emitter electrode is set so that boron ions implanted into the emitter electrode and diffused therein do not reach an emitter-base junction portion.
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Idota Ken
Kawashima Takahiro
Ohnishi Teruhito
Saitoh Tohru
Sano Tsuneichiro
Matsushita Electric - Industrial Co., Ltd.
McDermott Will & Emery llp
Novacek Christy
Smith Zandra V.
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