Beryllium-gold ohmic contact to a semiconductor device

Coating processes – Electrical product produced – Integrated circuit – printed circuit – or circuit board

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357 65, 357 71, 427 89, 427125, H01L 2348, H01L 2946, H01L 2962

Patent

active

044145616

ABSTRACT:
An ohmic contact to a semiconductor device comprising p-type InP is formed by sequentially depositing beryllium-gold and gold layers on InP and then heat-treating the device at a temperature less than 440 degrees C. An ohmic contact to p-type InGaAsP can be similarly formed.

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patent: 4000508 (1976-12-01), Hager et al.
patent: 4011583 (1977-03-01), Levinstein
patent: 4022931 (1977-05-01), Black et al.
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patent: 4260429 (1981-04-01), Moyer
patent: 4350990 (1982-09-01), Lo
patent: 4366186 (1982-12-01), Keramidas

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