Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2005-08-23
2005-08-23
Crane, Sara (Department: 2811)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S310000, C438S003000
Reexamination Certificate
active
06933549
ABSTRACT:
A barrier layer protecting, for example, a ferroelectric capacitor from hydrogen is described. The barrier layer comprises aluminum oxide with barrier enhancement dopants. The barrier enhancement dopants are selected from Ti, Hf, Zr, their oxides, or a combination thereof.
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Hornik Karl
Itokawa Hiroshi
Yamakawa Koji
Crane Sara
Horizon IP Pte Ltd.
Infineon Technologies Aktiengesellschaft
Kabushiki Kaisha Toshiba
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