Barrier layers for electroplated SnPb eutectic solder joints

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

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438612, 438613, H01L 2144

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active

059373202

ABSTRACT:
The present invention provides a means of fabricating a reliable C4 flip-chip structure for low-temperature joining. The electrochemically fabricated C4 interconnection has a barrier layer between the electroplated tin-rich solder bump and the ball-limiting metallurgy that protects the terminal metal in the ball-limiting metallurgy from attack by the Sn in the solder. The barrier layer is electroplated through the same photoresist mask as the solder and thus does not require a separate patterning step. A thin layer of electroplated nickel serves as a reliable barrier layer between a copper-based ball-limiting metallurgy and a tin-lead (Sn--Pb) eutectic C4 ball.

REFERENCES:
patent: 5162257 (1992-11-01), Yung
patent: 5391514 (1995-02-01), Gall et al.
patent: 5470787 (1995-11-01), Greer
patent: 5634268 (1997-06-01), Dalal et al.
Jean Audet, et al., "Low Cost Bumping Process for Flip Chip", Proc. 1995 International Flip Chip, BGA, and Ado Pkg. Symposium ITAP 95, '95 Flip Chip, BGA, TAB & AP Symposium, pp. 16-21 (1995).
M. Data, et al., "Electrochemical Fabrication of Mechanically Robust PbSn C4 Interconnections", J. Electrochem. Soc., vol. 142, No. 11, pp. 3779-3785 (Nov. 1995).
J.D. Mis, et al., "Flip Chip Production Experience: Some Design, Process, Reliability, and Cost Considerations", ISHM '96 Proceedings, Proc. 1996 International Symposium on Microelectronics SPIE vol. 2920, pp. 291-295 (1996).
S.K. Kang, et al., "Interfacial Reactions During Soldering With Lead-Tin Eutectic and Lead (Pb)-Free, Tin-Rich Solders", Journal of Electronic Materials, vol. 25, No. 7, pp. 1113-1120 (1996).
Eric Jung, et al., "The Influence of NiSn Intermetallics on the Performance of Flip Chip Contacts Using a Low Cost Electroless Nickel Bumping Approach", IEPS Proceedings of the Technical Conference, 1996 Electronics Packaging Conference, Austin, Texas, pp. 14-25 (Sep. 29-Oct. 1, 1996).

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