Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate
2006-11-14
2006-11-14
Elms, Richard (Department: 2824)
Static information storage and retrieval
Read/write circuit
Testing
C365S191000, C365S230030
Reexamination Certificate
active
07136315
ABSTRACT:
A parallel test circuit performs a selective test on a specific bank. The bank selectable parallel test circuit comprises a bank selecting control unit and a plurality of bank selecting units. The bank selecting control unit outputs a test mode control signal for selecting a test mode in response to a parallel test signal for controlling a parallel test and a compression test signal for controlling bank selection in the parallel test. Each of the plurality of bank selecting units, which correspond one by one to banks, selectively activates the corresponding banks in response to the test mode control signal and a bank selecting control signal.
REFERENCES:
patent: 5987635 (1999-11-01), Kishi et al.
patent: 6166967 (2000-12-01), Do
patent: 6262928 (2001-07-01), Kim et al.
patent: 6389563 (2002-05-01), Oh et al.
patent: 6400623 (2002-06-01), Ohno
patent: 6483760 (2002-11-01), Kang
patent: 6484289 (2002-11-01), Hsu
patent: 6662315 (2003-12-01), Gradinariu et al.
patent: 6693841 (2004-02-01), Roohparvar et al.
patent: 6762615 (2004-07-01), Lee et al.
patent: 6853597 (2005-02-01), Jain
patent: 2004/0184327 (2004-09-01), Okuda
patent: 2005/0041493 (2005-02-01), Maeda
patent: 2000-030491 (2000-01-01), None
patent: 2001-222898 (2001-08-01), None
patent: 91-10835 (1993-02-01), None
Elms Richard
Heller Ehrman LLP
Hynix / Semiconductor Inc.
Nguyen Dang
LandOfFree
Bank selectable parallel test circuit and parallel test... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Bank selectable parallel test circuit and parallel test..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Bank selectable parallel test circuit and parallel test... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3676174